Numerical Simulation and Process of Back-side Ultrafast Pulse Laser Grooving for SiC Wafers

HUANG Xiaolong, HU Xirui, FAN Xiaokang, ZHANG Chen

Journal of Netshape Forming Engineering ›› 2026, Vol. 18 ›› Issue (7) : 238-248.

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Journal of Netshape Forming Engineering ›› 2026, Vol. 18 ›› Issue (7) : 238-248. DOI: 10.3969/j.issn.1674-6457.2026.07.022
Fabrication and Processing of Refractory Metals and Hard Materials

Numerical Simulation and Process of Back-side Ultrafast Pulse Laser Grooving for SiC Wafers

  • HUANG Xiaolong1, HU Xirui2, FAN Xiaokang2, ZHANG Chen1,*
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Abstract

The work aims to explore the influence of laser power parameters on the grooving morphology to achieve precise control of groove morphology. Based on the coupling of the two-temperature model and the dynamic mesh technique, a three-dimensional thermodynamics model for picosecond pulse laser grooving of Cu/Ni metal layers was established. A systematic process parameter investigation was conducted to analyze the influence of laser power, scanning speed, and repetition rate on the temperature field distribution, residual stress state, and groove morphology. Experimental results demonstrated that laser power significantly modulated both groove width and depth. Under identical process parameters, the Cu layer exhibited larger groove depth and width compared with the Ni layer, along with lower residual stress levels. Scanning speed notably affected groove depth and formation quality due to variations in pulse overlap and irradiation count. At lower speeds, repeated laser ablation at the same location led to a gradual increase in groove depth over time, whereas at speeds above 600 mm/s, the depth profile stabilized, and forming consistency improved significantly. Moreover, at repetition rates below 100 kHz, obvious discontinuous regions appeared in the groove, while at frequencies above 100 kHz, the depth curve became smooth with negligible fluctuations, resulting in uniform and stable formation quality. In conclusion, this study clarifies the influence mechanisms of key laser parameters on back-side metal laser grooving quality through simulation and experimentation, providing a theoretical foundation and technical support for high-precision and highly reliable wafer grooving processing techniques.

Key words

laser grooving / two-temperature model / picosecond laser / numerical simulation / morphological control

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HUANG Xiaolong, HU Xirui, FAN Xiaokang, ZHANG Chen. Numerical Simulation and Process of Back-side Ultrafast Pulse Laser Grooving for SiC Wafers[J]. Journal of Netshape Forming Engineering. 2026, 18(7): 238-248 https://doi.org/10.3969/j.issn.1674-6457.2026.07.022

References

[1] CAO H T, HO J R, TUNG P C, et al.Machined Quality Prediction and Optimization for Micro-EDM Drilling of Semi-Conductive SiC Wafer[J]. Materials Science in Semiconductor Processing, 2024, 169: 107911.
[2] MUSOLINO M, CARRIA E, CRIPPA D, et al.Development of N-Type Epitaxial Growth on 200 mm 4H-SiC Wafers for the Next Generation of Power Devices[J]. Microelectronic Engineering, 2023, 274: 111976.
[3] LI M, MU D K, HUANG S Q, et al.Ultrathin Diamond Blades for Dicing Single Crystal SiC Developed Using a Novel Bonding Method[J]. Journal of Manufacturing Processes, 2022, 84: 88-99.
[4] CHEN F J, HUANG J H, XU J L.High-Precision Servo Control Design and Optimization for Dicing Semiconductor Wafer[J]. Journal of Manufacturing Processes, 2024, 117: 346-354.
[5] 陶凯, 丁海, 张佳艺, 等. 基于不同衬底材料的TiO2/Cu/Ag/TiO2多层复合透明导电薄膜的制备与性能研究[J]. 精密成形工程, 2025, 17(3): 188-197.
TAO K, DING H, ZHANG J Y, et al.Preparation and Properties of TiO2/Cu/Ag/TiO2 Multilayer Transparent Conductive Film on Different Substrate Materials[J]. Journal of Netshape Forming Engineering, 2025, 17(3): 188-197.
[6] LI J, LIU F, ZHOU W, et al.The Influence of Cracks in the Coupling Region of Micro-Grinding and Laser Stealth Combined Dicing on the Quality of Cutting Side Walls[J]. Journal of Manufacturing Processes, 2024, 119: 856-866.
[7] LI Y, GAO A, ZHANG Y, et al.Study on Multiple Dicing Technology for Silicon Wafer[J]. Equipment for Electronic Products Manufacturing, 2018, 47(1): 25-28
[8] FENG Y R, LI K N, DOU Z, et al.High-Speed Dicing of SiC Wafers with 0.048 mm Diamond Blades via Rolling-Slitting[J]. Materials, 2022, 15(22): 80-83.
[9] NISAR S, LI L, SHEIKH M A.Laser Glass Cutting Techniques—A Review[J]. Journal of Laser Applications, 2013, 25(4): 042010.
[10] WANG L F, ZHANG C, LIU F, et al.Process Mechanism of Ultrafast Laser Multi-Focal-Scribing for Ultrafine and Efficient Stealth Dicing of SiC Wafers[J]. Applied Physics A, 2022, 128(10): 872.
[11] LIU W D, WU B X.Nanosecond Laser Grooving of Water-Immersed Silicon Carbide Assisted by High Intensity Focused Ultrasound (HIFU)[J]. Journal of Manufacturing Processes, 2023, 105: 313-323.
[12] LIAO K, WANG W J, MEI X S, et al.High Quality Full Ablation Cutting and Stealth Dicing of Silica Glass Using Picosecond Laser Bessel Beam with Burst Mode[J]. Ceramics International, 2022, 48(7): 9805-9816.
[13] 梅志鹏, 岳永豪, 田燕, 等. 晶圆激光开槽工艺研究[J]. 应用激光, 2020, 40(2): 276-282.
MEI Z P, YUE Y H, TIAN Y, et al.Study on Laser Grooving Technology of Wafer[J]. Applied Laser, 2020, 40(2): 276-282.
[14] HUANG H.Study on Ultraviolet Laser Scratching Technology of High Brightness LED Wafer[D]. Harbin: Harbin Institute of Technology, 2009: 15-30
[15] LIU Z, WU B X, XU R, et al.Grooving of Metals by High-Intensity Focused Ultrasound-Assisted Water-Confined Laser Micromachining[J]. Journal of Manufacturing Science and Engineering, 2021, 143(9): 091012.
[16] YIN C P, ZHANG S T, DONG Y W, et al.Molecular-Dynamics Study of Multi-Pulsed Ultrafast Laser Interaction with Copper[J]. Advances in Production Engineering & Management, 2021, 16(4): 457-472.
[17] REN Y P, CHEN J K, ZHANG Y W.Modeling of Ultrafast Phase Changes in Metal Films Induced by an Ultrashort Laser Pulse Using a Semi-Classical Two-Temperature Model[J]. International Journal of Heat and Mass Transfer, 2012, 55(5/6): 1620-1627.
[18] XUE N, REN Y P, REN X D, et al.Phase Filed Simulation of Dendritic Growth of Copper Films Irradiated by Ultrashort Laser Pulses[J]. Computational Materials Science, 2018, 148: 60-68.
[19] ZHANG Z, ZHANG Q L, WANG W T, et al.Modelling and Experimental Study on Surface Texturing of Single Crystalline Diamond by Infrared Nanosecond Pulsed Laser[J]. Optics & Laser Technology, 2025, 192: 113446.
[20] ANISIMOV S I, KAPELIOVICH B L, PEREL’MAN T L. Electron Emission from Metal Surfaces Exposed to Ultrashort Laser Pulses[J]. Soviet Journal of Experimental and Theoretical Physics, 1974, 39: 375-377.
[21] PROMOPPATUM P, ONLER R, YAO S C.Numerical and Experimental Investigations of Micro and Macro Characteristics of Direct Metal Laser Sintered Ti-6Al-4V Products[J]. Journal of Materials Processing Technology, 2017, 240: 262-273.
[22] NIVAS J J, AMORUSO S.Generation of Supra-Wavelength Grooves in Femtosecond Laser Surface Structuring of Silicon[J]. Nanomaterials, 2021, 11(1): 174.
[23] ZHAO W, WANG L, YU Z, et al.A Processing Technology of Grooves by Picosecond Ultrashort Pulse Laser in Ni Alloy: Enhancing Efficiency and Quality[J]. Optic Laser Technology, 2019, 111: 214-221
[24] PRAKASH S, KUMAR S.Pulse Smearing and Profile Generation in CO2 Laser Micromachining on PMMA via Raster Scanning[J]. Journal of Manufacturing Processes, 2018, 31: 116-123.
[25] 吉勇, 杨昆, 李杨, 等. 低介电常数制程芯片激光开槽工艺及可靠性研究[J]. 微电子学, 2025, 55(4): 678-683.
JI Y, YANG K, LI Y, et al.Research on Laser Grooving Process and Reliability of Low-K Chips[J]. Microelectronics, 2025, 55(4): 678-683.
[26] 李曼, 彭川, 冯晨, 等. Low-K芯片的激光开槽工艺质量稳定性控制[J]. 电子产品可靠性与环境试验, 2022, 40(4): 17-23.
LI M, PENG C, FENG C, et al.Quality Stability Control of Laser Grooving Process for Low-K Chip[J]. Electronic Product Reliability and Environmental Testing, 2022, 40(4): 17-23.

Funding

“Open Bidding for Selecting the Best Candidates” Project of Wuhan East Lake High-tech Development Zone (2023KBJ214)
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